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  • Electrical measurements of conductive thin films and electronic devices.

    T.E.I. of Crete, School of Engineering (STEF), Department of Electrical Engineering
    Authors: Dakalopoulos, Kritolaos
    Thesis advisor: Kymakis, Emmanouil
    Publication Date: 20-05-2013
    Technological advancement on electronic devices, for many decades now, is based on electrical properties shown by thin films of conductive, semiconductive and dielectric materials. The development and production of such ...